TEST_NAME : Wafer
TEST_DATE : 24_08_19-11_20_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-007-018-018-06 | FUSED_ID : 6359364768380297510
  IC_TEMP :  -56.22 | VDDM : 1116.14 | AUX_INT :  -10.86 | CsaBias :   69.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.99662e-03 / 2
  ADC_P0  : -1.08554e-02 ± 3.03508e-02
  ADC_P1  : 8.12432e-03 ± 7.18036e-04
  ADC_P2  : -5.23476e-06 ± 3.39686e-06
  CSA_Chi2/NDF : 1.17536e-04 / 2
  CSA_P0  : 5.73857e-02 ± 7.23117e-03
  CSA_P1  : 9.46368e-03 ± 5.44816e-04
  CSA_P2  : -4.31026e-05 ± 8.29691e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [3, 4, 20, 28, 29, 31, 37, 60, 70, 94, 110, 115, 126, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [29, 30, 33, 40, 52, 56, 67, 83, 88, 96, 100, 101, 104, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3106', '1.800', '0.1266', '1.799', '0.0954', '7.000', '0.7073', 1, 1, 1, 1, 1724059218.8105159]
VI_after__Init : ['1.201', '0.3106', '1.800', '0.1266', '1.800', '0.0896', '7.000', '0.7070', 1, 1, 1, 1, 1724059226.8079343]
VI_at__the_End : ['1.201', '0.4787', '1.800', '0.1333', '1.802', '0.1137', '7.000', '0.7082', 1, 1, 1, 1, 1724059281.8897634]