TEST_NAME : Wafer
TEST_DATE : 24_08_19-19_05_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-008-008-026-00 | FUSED_ID : 6359364768381305248
  IC_TEMP :  -81.65 | VDDM : 1117.31 | AUX_INT :   -5.62 | CsaBias :   53.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00110e-03 / 2
  ADC_P0  : -5.61956e-03 ± 2.14880e-02
  ADC_P1  : 8.47935e-03 ± 5.58621e-04
  ADC_P2  : -4.73073e-06 ± 2.86589e-06
  CSA_Chi2/NDF : 1.77951e-04 / 2
  CSA_P0  : 9.73249e-02 ± 8.89760e-03
  CSA_P1  : 9.43413e-03 ± 6.70370e-04
  CSA_P2  : -5.55476e-05 ± 1.02089e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [1, 3, 4, 13, 15, 20, 26, 34, 53, 78, 95, 106, 108, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [0, 15, 22, 31, 43, 46, 49, 53, 69, 75, 88, 104, 112, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.5740', '1.800', '0.1256', '1.799', '0.1042', '7.000', '0.7075', 1, 1, 1, 1, 1724087114.0832734]
VI_after__Init : ['1.201', '0.3172', '1.800', '0.1289', '1.800', '0.0938', '7.000', '0.7074', 1, 1, 1, 1, 1724087122.110649]
VI_at__the_End : ['1.202', '0.4690', '1.800', '0.1306', '1.751', '0.1200', '7.000', '0.7081', 1, 1, 1, 1, 1724087177.7814786]