TEST_NAME : Wafer
TEST_DATE : 24_08_19-22_14_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-008-013-025-11 | FUSED_ID : 6359364768381325723
  IC_TEMP :  -83.00 | VDDM : 1205.61 | AUX_INT : -913.96 | CsaBias : -696.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.80995e-02 / 2
  ADC_P0  : -9.13956e-01 ± 3.50547e-01
  ADC_P1  : 2.22987e-02 ± 6.81265e-03
  ADC_P2  : -5.44552e-05 ± 2.73163e-05
  CSA_Chi2/NDF : 1.76183e-04 / 2
  CSA_P0  : 5.91607e-02 ± 8.85329e-03
  CSA_P1  : 1.00662e-02 ± 6.67032e-04
  CSA_P2  : -5.47230e-05 ± 1.01581e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [5, 21, 28, 31, 48, 49, 54, 71, 88, 92, 104, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [5, 42, 53, 56, 57, 76, 84, 90, 96, 99, 108, 111, 112, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1957', '1.800', '0.1540', '1.799', '0.0916', '7.000', '0.7076', 1, 1, 1, 1, 1724098476.2529073]
VI_after__Init : ['1.201', '0.1957', '1.800', '0.1541', '1.800', '0.0861', '7.000', '0.7073', 1, 1, 1, 1, 1724098484.2653084]
VI_at__the_End : ['1.202', '0.4716', '1.800', '0.1323', '1.799', '0.1173', '7.000', '0.7083', 1, 1, 1, 1, 1724098540.5660243]