TEST_NAME : Wafer
TEST_DATE : 24_08_20-00_48_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-008-017-022-13 | FUSED_ID : 6359364768381342061
  IC_TEMP :  -67.44 | VDDM : 1118.23 | AUX_INT :   -9.71 | CsaBias :   64.98
  CONF_FAIL_REG : 1
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74079e-03 / 2
  ADC_P0  : -9.70971e-03 ± 2.83323e-02
  ADC_P1  : 8.34817e-03 ± 6.93360e-04
  ADC_P2  : -5.52373e-06 ± 3.37906e-06
  CSA_Chi2/NDF : 1.81427e-04 / 2
  CSA_P0  : 5.66235e-02 ± 8.98407e-03
  CSA_P1  : 9.74750e-03 ± 6.76885e-04
  CSA_P2  : -5.21739e-05 ± 1.03082e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [8, 12, 20, 44, 48, 56, 66, 70, 74, 86, 89, 91, 104, 105, 106, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 1, 9, 15, 28, 38, 43, 58, 89, 101, 104, 112, 117, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1417', '1.800', '0.1219', '1.799', '0.0886', '7.000', '0.7072', 1, 1, 1, 1, 1724107736.473639]
VI_after__Init : ['1.201', '0.1417', '1.800', '0.1207', '1.800', '0.0828', '7.000', '0.7071', 1, 1, 1, 1, 1724107744.5010226]
VI_at__the_End : ['1.201', '0.4607', '1.800', '0.1322', '1.802', '0.1164', '7.000', '0.7081', 1, 1, 1, 1, 1724107799.7527087]