TEST_NAME : Wafer
TEST_DATE : 24_08_20-08_48_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-003-011-13 | FUSED_ID : 6359364768382333117
  IC_TEMP : -111.85 | VDDM : 1118.30 | AUX_INT :  -13.86 | CsaBias :   34.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.71756e-03 / 2
  ADC_P0  : -1.38595e-02 ± 3.53100e-02
  ADC_P1  : 9.71769e-03 ± 9.51445e-04
  ADC_P2  : -9.06198e-06 ± 5.14720e-06
  CSA_Chi2/NDF : 7.77726e-05 / 2
  CSA_P0  : 5.91063e-02 ± 5.88214e-03
  CSA_P1  : 1.02887e-02 ± 4.43177e-04
  CSA_P2  : -7.98015e-05 ± 6.74906e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [7, 14, 18, 32, 41, 49, 63, 83, 86, 88, 92, 94, 96, 111, 113, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [5, 34, 46, 49, 69, 101, 105, 112, 116, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3098', '1.800', '0.1349', '1.799', '0.1063', '7.000', '0.7071', 1, 1, 1, 1, 1724136505.788934]
VI_after__Init : ['1.201', '0.3115', '1.800', '0.1363', '1.800', '0.1003', '7.000', '0.7072', 1, 1, 1, 1, 1724136513.7663698]
VI_at__the_End : ['1.201', '0.3887', '1.800', '0.1294', '1.624', '0.1201', '7.000', '0.7076', 1, 1, 1, 1, 1724136569.1952522]