TEST_NAME : Wafer
TEST_DATE : 24_08_20-08_41_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-003-015-13 | FUSED_ID : 6359364768382333181
  IC_TEMP : -107.37 | VDDM : 1126.55 | AUX_INT :  -12.75 | CsaBias :   33.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.58692e-03 / 2
  ADC_P0  : -1.27468e-02 ± 3.45238e-02
  ADC_P1  : 9.27590e-03 ± 9.05919e-04
  ADC_P2  : -7.76647e-06 ± 4.75856e-06
  CSA_Chi2/NDF : 7.57073e-05 / 2
  CSA_P0  : 5.78144e-02 ± 5.80352e-03
  CSA_P1  : 1.03139e-02 ± 4.37253e-04
  CSA_P2  : -7.90651e-05 ± 6.65885e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [9, 28, 30, 43, 57, 69, 76, 83, 89, 95, 101, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [8, 9, 29, 38, 43, 45, 47, 99, 105, 107, 110, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3525', '1.800', '0.1231', '1.799', '0.1051', '7.000', '0.7079', 1, 1, 1, 1, 1724136080.304129]
VI_after__Init : ['1.201', '0.3567', '1.800', '0.1244', '1.800', '0.0970', '7.000', '0.7072', 1, 1, 1, 1, 1724136088.2685537]
VI_at__the_End : ['1.201', '0.3923', '1.800', '0.1280', '1.629', '0.1201', '7.000', '0.7079', 1, 1, 1, 1, 1724136143.4575813]