TEST_NAME : Wafer
TEST_DATE : 24_08_20-08_34_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-003-019-10 | FUSED_ID : 6359364768382333242
  IC_TEMP :  -98.86 | VDDM : 1123.49 | AUX_INT :  -13.20 | CsaBias :   25.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.38229e-03 / 2
  ADC_P0  : -1.32014e-02 ± 3.29819e-02
  ADC_P1  : 9.69976e-03 ± 8.74209e-04
  ADC_P2  : -9.86579e-06 ± 4.62391e-06
  CSA_Chi2/NDF : 1.00983e-04 / 2
  CSA_P0  : 5.79633e-02 ± 6.70264e-03
  CSA_P1  : 1.05596e-02 ± 5.04996e-04
  CSA_P2  : -7.75700e-05 ± 7.69049e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [2, 16, 39, 41, 59, 69, 70, 77, 78, 88, 90, 93, 101, 106, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [5, 16, 31, 53, 70, 73, 74, 76, 119, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3029', '1.800', '0.1497', '1.799', '0.0928', '7.000', '0.7072', 1, 1, 1, 1, 1724135654.5967903]
VI_after__Init : ['1.201', '0.3051', '1.800', '0.1504', '1.800', '0.0870', '7.000', '0.7072', 1, 1, 1, 1, 1724135662.5531607]
VI_at__the_End : ['1.201', '0.4120', '1.800', '0.1300', '1.657', '0.1201', '7.000', '0.7079', 1, 1, 1, 1, 1724135717.7162492]