TEST_NAME : Wafer
TEST_DATE : 24_08_20-09_07_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-004-012-05 | FUSED_ID : 6359364768382337221
  IC_TEMP : -101.87 | VDDM : 1107.94 | AUX_INT :  -13.09 | CsaBias :   42.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.30638e-03 / 2
  ADC_P0  : -1.30917e-02 ± 3.24501e-02
  ADC_P1  : 9.38961e-03 ± 8.46349e-04
  ADC_P2  : -8.43199e-06 ± 4.43663e-06
  CSA_Chi2/NDF : 8.72172e-05 / 2
  CSA_P0  : 5.89029e-02 ± 6.22907e-03
  CSA_P1  : 1.06509e-02 ± 4.69316e-04
  CSA_P2  : -8.10419e-05 ± 7.14712e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [22, 25, 28, 35, 53, 94, 95, 103, 105, 112, 115, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [2, 8, 12, 16, 22, 35, 57, 60, 81, 90, 94, 109, 120, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3706', '1.800', '0.1237', '1.799', '0.1087', '7.000', '0.7072', 1, 1, 1, 1, 1724137670.579503]
VI_after__Init : ['1.201', '0.3763', '1.800', '0.1245', '1.800', '0.1030', '7.000', '0.7071', 1, 1, 1, 1, 1724137678.62985]
VI_at__the_End : ['1.201', '0.4053', '1.800', '0.1316', '1.671', '0.1200', '7.000', '0.7076', 1, 1, 1, 1, 1724137733.9134405]