TEST_NAME : Wafer
TEST_DATE : 24_08_20-09_13_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-004-015-05 | FUSED_ID : 6359364768382337269
  IC_TEMP :  -82.35 | VDDM : 1123.51 | AUX_INT :   -9.72 | CsaBias :   43.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61765e-03 / 2
  ADC_P0  : -9.72485e-03 ± 2.73006e-02
  ADC_P1  : 8.97901e-03 ± 7.19334e-04
  ADC_P2  : -6.31778e-06 ± 3.77929e-06
  CSA_Chi2/NDF : 1.60786e-04 / 2
  CSA_P0  : 5.99024e-02 ± 8.45759e-03
  CSA_P1  : 1.04608e-02 ± 6.37219e-04
  CSA_P2  : -7.05114e-05 ± 9.70409e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [0, 29, 31, 35, 39, 43, 45, 48, 51, 65, 75, 78, 105, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [4, 15, 25, 26, 34, 56, 59, 65, 68, 89, 100, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4031', '1.800', '0.1515', '1.799', '0.1047', '7.000', '0.7070', 1, 1, 1, 1, 1724137989.5512345]
VI_after__Init : ['1.201', '0.4082', '1.800', '0.1524', '1.800', '0.0989', '7.000', '0.7070', 1, 1, 1, 1, 1724137997.6216614]
VI_at__the_End : ['1.201', '0.4361', '1.800', '0.1349', '1.736', '0.1200', '7.000', '0.7076', 1, 1, 1, 1, 1724138053.7602227]