TEST_NAME : Wafer
TEST_DATE : 24_08_20-09_22_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-004-020-02 | FUSED_ID : 6359364768382337346
  IC_TEMP :  -86.67 | VDDM : 1119.84 | AUX_INT :   -8.97 | CsaBias :   47.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15887e-03 / 2
  ADC_P0  : -8.97317e-03 ± 2.29918e-02
  ADC_P1  : 9.48011e-03 ± 6.23582e-04
  ADC_P2  : -8.28526e-06 ± 3.35683e-06
  CSA_Chi2/NDF : 1.39560e-04 / 2
  CSA_P0  : 5.99238e-02 ± 7.87958e-03
  CSA_P1  : 1.07537e-02 ± 5.93669e-04
  CSA_P2  : -7.45081e-05 ± 9.04088e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [18, 34, 35, 44, 47, 53, 72, 84, 85, 95, 99, 101, 110, 111, 123, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [25, 36, 37, 43, 48, 50, 80, 87, 88, 101, 115, 122, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2261', '1.800', '0.1408', '1.799', '0.0974', '7.000', '0.7069', 1, 1, 1, 1, 1724138521.940837]
VI_after__Init : ['1.201', '0.2260', '1.800', '0.1411', '1.800', '0.0912', '7.000', '0.7068', 1, 1, 1, 1, 1724138529.9342196]
VI_at__the_End : ['1.201', '0.4379', '1.800', '0.1364', '1.744', '0.1200', '7.000', '0.7076', 1, 1, 1, 1, 1724138585.2779477]