TEST_NAME : Wafer
TEST_DATE : 24_08_20-09_25_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-004-022-02 | FUSED_ID : 6359364768382337378
  IC_TEMP :  -80.57 | VDDM : 1120.69 | AUX_INT :  -10.18 | CsaBias :   53.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45351e-03 / 2
  ADC_P0  : -1.01769e-02 ± 2.57541e-02
  ADC_P1  : 9.20773e-03 ± 6.70465e-04
  ADC_P2  : -8.07198e-06 ± 3.47166e-06
  CSA_Chi2/NDF : 2.06944e-04 / 2
  CSA_P0  : 5.79767e-02 ± 9.59509e-03
  CSA_P1  : 1.06048e-02 ± 7.22921e-04
  CSA_P2  : -6.94217e-05 ± 1.10092e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [5, 18, 59, 63, 76, 77, 93, 101, 106, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [6, 11, 19, 36, 37, 53, 60, 64, 67, 97, 98, 119, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1758', '1.800', '0.1324', '1.800', '0.0966', '7.000', '0.7072', 1, 1, 1, 1, 1724138734.0175238]
VI_after__Init : ['1.201', '0.1761', '1.800', '0.1323', '1.800', '0.0908', '7.000', '0.7069', 1, 1, 1, 1, 1724138741.9738553]
VI_at__the_End : ['1.201', '0.4468', '1.800', '0.1352', '1.738', '0.1201', '7.000', '0.7076', 1, 1, 1, 1, 1724138797.9005613]