TEST_NAME : Wafer
TEST_DATE : 24_08_20-09_55_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-005-010-08 | FUSED_ID : 6359364768382341288
  IC_TEMP : -102.58 | VDDM : 1115.32 | AUX_INT :  -12.87 | CsaBias :   34.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.28299e-03 / 2
  ADC_P0  : -1.28686e-02 ± 3.23144e-02
  ADC_P1  : 9.44276e-03 ± 8.45397e-04
  ADC_P2  : -8.81620e-06 ± 4.42411e-06
  CSA_Chi2/NDF : 9.49290e-05 / 2
  CSA_P0  : 5.89568e-02 ± 6.49863e-03
  CSA_P1  : 1.02344e-02 ± 4.89625e-04
  CSA_P2  : -7.59113e-05 ± 7.45641e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [4, 11, 15, 21, 33, 45, 55, 60, 61, 84, 86, 112, 123, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [20, 25, 29, 42, 44, 54, 78, 83, 88, 109, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1576', '1.800', '0.1496', '1.799', '0.0952', '7.000', '0.7069', 1, 1, 1, 1, 1724140541.9421933]
VI_after__Init : ['1.201', '0.1576', '1.800', '0.1502', '1.800', '0.0891', '7.000', '0.7067', 1, 1, 1, 1, 1724140549.9896135]
VI_at__the_End : ['1.201', '0.4008', '1.800', '0.1301', '1.683', '0.1199', '7.000', '0.7073', 1, 1, 1, 1, 1724140605.645378]