TEST_NAME : Wafer
TEST_DATE : 24_08_20-09_52_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-005-012-08 | FUSED_ID : 6359364768382341320
  IC_TEMP :  -89.56 | VDDM : 1109.48 | AUX_INT :  -11.79 | CsaBias :   40.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.10106e-03 / 2
  ADC_P0  : -1.17928e-02 ± 3.11092e-02
  ADC_P1  : 8.76389e-03 ± 7.88515e-04
  ADC_P2  : -6.11000e-06 ± 4.01565e-06
  CSA_Chi2/NDF : 1.41016e-04 / 2
  CSA_P0  : 5.60702e-02 ± 7.92056e-03
  CSA_P1  : 1.03013e-02 ± 5.96757e-04
  CSA_P2  : -7.34891e-05 ± 9.08791e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [3, 6, 28, 34, 42, 59, 91, 96, 102, 104, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [6, 11, 15, 17, 20, 23, 24, 29, 49, 50, 68, 92, 101, 117, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2481', '1.800', '0.1564', '1.799', '0.0957', '7.000', '0.7068', 1, 1, 1, 1, 1724140327.9886267]
VI_after__Init : ['1.201', '0.2512', '1.800', '0.1575', '1.799', '0.0901', '7.000', '0.7069', 1, 1, 1, 1, 1724140336.1260526]
VI_at__the_End : ['1.201', '0.4087', '1.803', '0.1312', '1.707', '0.1200', '7.000', '0.7075', 1, 1, 1, 1, 1724140391.3857896]