TEST_NAME : Wafer
TEST_DATE : 24_08_20-09_46_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-005-015-08 | FUSED_ID : 6359364768382341368
  IC_TEMP :  -87.05 | VDDM : 1124.21 | AUX_INT :   -9.04 | CsaBias :   61.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23812e-03 / 2
  ADC_P0  : -9.04454e-03 ± 2.38002e-02
  ADC_P1  : 8.92592e-03 ± 6.13294e-04
  ADC_P2  : -7.00026e-06 ± 3.13993e-06
  CSA_Chi2/NDF : 1.49058e-04 / 2
  CSA_P0  : 5.78108e-02 ± 8.14330e-03
  CSA_P1  : 1.03323e-02 ± 6.13539e-04
  CSA_P2  : -6.94006e-05 ± 9.34347e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [5, 17, 22, 43, 48, 65, 73, 83, 85, 92, 93, 112, 116, 117, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [11, 23, 28, 42, 56, 74, 83, 91, 102, 105, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3445', '1.800', '0.1314', '1.799', '0.0966', '7.000', '0.7069', 1, 1, 1, 1, 1724140010.1541457]
VI_after__Init : ['1.201', '0.3452', '1.800', '0.1317', '1.800', '0.0919', '7.000', '0.7069', 1, 1, 1, 1, 1724140017.4995348]
VI_at__the_End : ['1.201', '0.4294', '1.800', '0.1334', '1.730', '0.1200', '7.000', '0.7072', 1, 1, 1, 1, 1724140074.5431452]