TEST_NAME : Wafer
TEST_DATE : 24_08_20-09_32_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-005-023-15 | FUSED_ID : 6359364768382341503
  IC_TEMP :  -73.30 | VDDM : 1123.09 | AUX_INT :   -8.75 | CsaBias :   53.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09348e-03 / 2
  ADC_P0  : -8.75497e-03 ± 2.23310e-02
  ADC_P1  : 8.89061e-03 ± 5.70102e-04
  ADC_P2  : -7.15665e-06 ± 2.89036e-06
  CSA_Chi2/NDF : 1.79248e-04 / 2
  CSA_P0  : 5.80224e-02 ± 8.92995e-03
  CSA_P1  : 1.05144e-02 ± 6.72808e-04
  CSA_P2  : -6.55897e-05 ± 1.02461e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [18, 20, 21, 33, 34, 35, 48, 76, 81, 87, 94, 104, 120, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [21, 30, 32, 33, 34, 43, 60, 93, 94, 97, 101, 112, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2444', '1.800', '0.1192', '1.799', '0.0926', '7.000', '0.7070', 1, 1, 1, 1, 1724139159.576584]
VI_after__Init : ['1.201', '0.2447', '1.800', '0.1194', '1.800', '0.0865', '7.000', '0.7070', 1, 1, 1, 1, 1724139168.269914]
VI_at__the_End : ['1.201', '0.4546', '1.800', '0.1378', '1.770', '0.1200', '7.000', '0.7076', 1, 1, 1, 1, 1724139225.2735155]