TEST_NAME : Wafer
TEST_DATE : 24_08_20-10_11_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-006-005-06 | FUSED_ID : 6359364768382345302
  IC_TEMP : -103.58 | VDDM : 1108.80 | AUX_INT :  -14.34 | CsaBias :   46.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.44766e-03 / 2
  ADC_P0  : -1.43438e-02 ± 4.00498e-02
  ADC_P1  : 8.78104e-03 ± 1.03005e-03
  ADC_P2  : -5.04240e-06 ± 5.38523e-06
  CSA_Chi2/NDF : 6.97900e-05 / 2
  CSA_P0  : 5.79426e-02 ± 5.57210e-03
  CSA_P1  : 1.06874e-02 ± 4.19818e-04
  CSA_P2  : -8.30156e-05 ± 6.39333e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [17, 28, 34, 35, 57, 80, 81, 84, 85, 89, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [5, 7, 12, 20, 25, 26, 37, 39, 46, 48, 52, 74, 80, 94, 107, 125, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3055', '1.800', '0.1596', '1.799', '0.1039', '7.000', '0.7069', 1, 1, 1, 1, 1724141493.903066]
VI_after__Init : ['1.201', '0.3065', '1.800', '0.1604', '1.800', '0.0986', '7.000', '0.7069', 1, 1, 1, 1, 1724141502.0134788]
VI_at__the_End : ['1.201', '0.3998', '1.800', '0.1311', '1.726', '0.1201', '7.000', '0.7076', 1, 1, 1, 1, 1724141557.4829128]