TEST_NAME : Wafer
TEST_DATE : 24_08_20-10_22_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-006-011-06 | FUSED_ID : 6359364768382345398
  IC_TEMP :  -94.86 | VDDM : 1125.98 | AUX_INT :  -10.53 | CsaBias :   52.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73562e-03 / 2
  ADC_P0  : -1.05318e-02 ± 2.82654e-02
  ADC_P1  : 9.02089e-03 ± 7.42993e-04
  ADC_P2  : -6.44987e-06 ± 3.90731e-06
  CSA_Chi2/NDF : 1.01413e-04 / 2
  CSA_P0  : 5.89141e-02 ± 6.71690e-03
  CSA_P1  : 1.05908e-02 ± 5.06070e-04
  CSA_P2  : -7.75733e-05 ± 7.70684e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [2, 19, 21, 24, 35, 46, 72, 75, 113, 114, 116, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [4, 11, 19, 22, 28, 31, 33, 46, 47, 50, 75, 81, 99, 104, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2635', '1.800', '0.1291', '1.800', '0.0999', '7.000', '0.7068', 1, 1, 1, 1, 1724142133.2241945]
VI_after__Init : ['1.201', '0.2642', '1.800', '0.1300', '1.800', '0.0941', '7.000', '0.7069', 1, 1, 1, 1, 1724142141.2065897]
VI_at__the_End : ['1.201', '0.4157', '1.800', '0.1335', '1.700', '0.1201', '7.000', '0.7074', 1, 1, 1, 1, 1724142196.7931826]