TEST_NAME : Wafer
TEST_DATE : 24_08_20-10_36_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-006-019-01 | FUSED_ID : 6359364768382345521
  IC_TEMP :  -75.56 | VDDM : 1123.50 | AUX_INT :   -9.70 | CsaBias :   60.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33699e-03 / 2
  ADC_P0  : -9.70085e-03 ± 2.47047e-02
  ADC_P1  : 8.80465e-03 ± 6.19606e-04
  ADC_P2  : -7.14400e-06 ± 3.09108e-06
  CSA_Chi2/NDF : 1.40118e-04 / 2
  CSA_P0  : 5.83758e-02 ± 7.89531e-03
  CSA_P1  : 9.99715e-03 ± 5.94855e-04
  CSA_P2  : -5.99927e-05 ± 9.05893e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [42, 45, 48, 55, 64, 71, 74, 89, 96, 102, 107, 108, 110, 116, 118, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [2, 4, 5, 7, 14, 16, 33, 69, 95, 100, 103, 104, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3243', '1.800', '0.1366', '1.799', '0.0968', '7.000', '0.7065', 1, 1, 1, 1, 1724142983.449474]
VI_after__Init : ['1.201', '0.3247', '1.800', '0.1373', '1.800', '0.0908', '7.000', '0.7066', 1, 1, 1, 1, 1724142991.4138632]
VI_at__the_End : ['1.201', '0.4441', '1.800', '0.1352', '1.766', '0.1198', '7.000', '0.7075', 1, 1, 1, 1, 1724143045.9058664]