TEST_NAME : Wafer
TEST_DATE : 24_08_20-10_39_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-006-021-01 | FUSED_ID : 6359364768382345553
  IC_TEMP :  -79.12 | VDDM : 1122.86 | AUX_INT :   -7.52 | CsaBias :   46.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10780e-03 / 2
  ADC_P0  : -7.51632e-03 ± 2.25499e-02
  ADC_P1  : 9.00272e-03 ± 5.98820e-04
  ADC_P2  : -6.63272e-06 ± 3.14506e-06
  CSA_Chi2/NDF : 1.55194e-04 / 2
  CSA_P0  : 6.08802e-02 ± 8.30921e-03
  CSA_P1  : 1.05877e-02 ± 6.26039e-04
  CSA_P2  : -6.82448e-05 ± 9.53384e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [12, 21, 28, 32, 72, 75, 84, 88, 90, 93, 97, 102, 108, 114, 115, 121, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [11, 27, 38, 40, 46, 52, 61, 86, 88, 89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2210', '1.800', '0.1265', '1.799', '0.0916', '7.000', '0.7069', 1, 1, 1, 1, 1724143195.8668187]
VI_after__Init : ['1.201', '0.2211', '1.800', '0.1266', '1.801', '0.0863', '7.000', '0.7069', 1, 1, 1, 1, 1724143204.023236]
VI_at__the_End : ['1.201', '0.4528', '1.800', '0.1384', '1.745', '0.1199', '7.000', '0.7075', 1, 1, 1, 1, 1724143258.664164]