TEST_NAME : Wafer
TEST_DATE : 24_08_20-10_47_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-006-025-01 | FUSED_ID : 6359364768382345617
  IC_TEMP :  -59.96 | VDDM : 1124.94 | AUX_INT :   -9.11 | CsaBias :   67.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31708e-03 / 2
  ADC_P0  : -9.11197e-03 ± 2.45960e-02
  ADC_P1  : 8.56956e-03 ± 6.18425e-04
  ADC_P2  : -5.81590e-06 ± 3.09859e-06
  CSA_Chi2/NDF : 1.91703e-04 / 2
  CSA_P0  : 5.72019e-02 ± 9.23499e-03
  CSA_P1  : 1.06310e-02 ± 6.95790e-04
  CSA_P2  : -6.05250e-05 ± 1.05961e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [40, 43, 65, 85, 87, 107, 110, 114, 115, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [5, 16, 29, 30, 52, 61, 67, 71, 90, 92, 99, 105, 110, 114, 116, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4045', '1.800', '0.1555', '1.800', '0.1028', '7.000', '0.7074', 1, 1, 1, 1, 1724143621.5548484]
VI_after__Init : ['1.201', '0.4050', '1.800', '0.1556', '1.800', '0.0968', '7.000', '0.7070', 1, 1, 1, 1, 1724143629.5052407]
VI_at__the_End : ['1.201', '0.4816', '1.800', '0.1350', '1.804', '0.1163', '7.000', '0.7081', 1, 1, 1, 1, 1724143684.9880013]