TEST_NAME : Wafer
TEST_DATE : 24_08_20-11_15_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-007-012-11 | FUSED_ID : 6359364768382349515
  IC_TEMP :  -78.32 | VDDM : 1117.91 | AUX_INT :   -9.98 | CsaBias :   51.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64749e-03 / 2
  ADC_P0  : -9.97788e-03 ± 2.75404e-02
  ADC_P1  : 8.82383e-03 ± 7.09939e-04
  ADC_P2  : -6.20369e-06 ± 3.65039e-06
  CSA_Chi2/NDF : 1.73197e-04 / 2
  CSA_P0  : 5.68968e-02 ± 8.77794e-03
  CSA_P1  : 1.00002e-02 ± 6.61354e-04
  CSA_P2  : -6.39245e-05 ± 1.00716e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [10, 31, 46, 48, 70, 82, 87, 88, 89, 90, 100, 109, 117, 120, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [17, 25, 33, 35, 51, 56, 75, 85, 94, 95, 108, 109, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4221', '1.800', '0.1467', '1.799', '0.0964', '7.000', '0.7073', 1, 1, 1, 1, 1724145327.0150828]
VI_after__Init : ['1.201', '0.4258', '1.800', '0.1480', '1.800', '0.0915', '7.000', '0.7074', 1, 1, 1, 1, 1724145335.0176244]
VI_at__the_End : ['1.201', '0.4295', '1.800', '0.1327', '1.765', '0.1198', '7.000', '0.7081', 1, 1, 1, 1, 1724145390.4360106]