TEST_NAME : Wafer
TEST_DATE : 24_08_20-10_57_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-007-022-12 | FUSED_ID : 6359364768382349676
  IC_TEMP :  -78.90 | VDDM : 1126.63 | AUX_INT : -117.36 | CsaBias :  -43.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.99942e-03 / 2
  ADC_P0  : -1.17360e-01 ± 4.52740e-02
  ADC_P1  : 1.05773e-02 ± 1.10747e-03
  ADC_P2  : -1.31332e-05 ± 5.35285e-06
  CSA_Chi2/NDF : 1.42253e-04 / 2
  CSA_P0  : 5.84366e-02 ± 7.95525e-03
  CSA_P1  : 1.00081e-02 ± 5.99370e-04
  CSA_P2  : -6.31110e-05 ± 9.12770e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [5, 12, 13, 15, 22, 25, 27, 33, 72, 74, 89, 93, 96, 108, 110, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [22, 26, 27, 35, 41, 43, 66, 86, 87, 98, 103, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1856', '1.800', '0.1649', '1.799', '0.0884', '7.000', '0.7073', 1, 1, 1, 1, 1724144261.5647302]
VI_after__Init : ['1.201', '0.1859', '1.800', '0.1650', '1.800', '0.0833', '7.000', '0.7072', 1, 1, 1, 1, 1724144269.5611143]
VI_at__the_End : ['1.201', '0.4333', '1.800', '0.1314', '1.776', '0.1198', '7.000', '0.7078', 1, 1, 1, 1, 1724144325.1698663]