TEST_NAME : Wafer
TEST_DATE : 24_08_20-10_55_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-007-023-12 | FUSED_ID : 6359364768382349692
  IC_TEMP :  -70.96 | VDDM : 1126.99 | AUX_INT :   -8.70 | CsaBias :   44.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33409e-03 / 2
  ADC_P0  : -8.69662e-03 ± 2.47648e-02
  ADC_P1  : 8.90627e-03 ± 6.47874e-04
  ADC_P2  : -6.39754e-06 ± 3.36663e-06
  CSA_Chi2/NDF : 1.58475e-04 / 2
  CSA_P0  : 5.92544e-02 ± 8.39658e-03
  CSA_P1  : 1.04424e-02 ± 6.32622e-04
  CSA_P2  : -6.33412e-05 ± 9.63408e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  19
 | N_BROKEN_FAST :  [6, 12, 16, 23, 27, 41, 47, 48, 57, 66, 67, 68, 77, 78, 90, 100, 110, 116, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [9, 13, 18, 32, 34, 52, 55, 58, 74, 92, 99, 113, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3464', '1.800', '0.1327', '1.799', '0.1037', '7.000', '0.7072', 1, 1, 1, 1, 1724144154.5089645]
VI_after__Init : ['1.201', '0.3466', '1.800', '0.1328', '1.801', '0.0979', '7.000', '0.7073', 1, 1, 1, 1, 1724144162.6384096]
VI_at__the_End : ['1.201', '0.4604', '1.800', '0.1366', '1.800', '0.1205', '7.000', '0.7080', 1, 1, 1, 1, 1724144218.1031406]