TEST_NAME : Wafer
TEST_DATE : 24_08_20-11_50_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-008-012-15 | FUSED_ID : 6359364768382353615
  IC_TEMP :  -85.71 | VDDM : 1126.36 | AUX_INT :   -9.43 | CsaBias :   51.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.56299e-03 / 2
  ADC_P0  : -9.43406e-03 ± 2.68457e-02
  ADC_P1  : 8.77638e-03 ± 6.95995e-04
  ADC_P2  : -5.83036e-06 ± 3.59650e-06
  CSA_Chi2/NDF : 1.28251e-04 / 2
  CSA_P0  : 6.08952e-02 ± 7.55358e-03
  CSA_P1  : 1.07397e-02 ± 5.69108e-04
  CSA_P2  : -7.46174e-05 ± 8.66684e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [16, 25, 32, 41, 43, 51, 58, 70, 81, 92, 102, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [14, 15, 17, 19, 25, 26, 36, 43, 81, 107, 120, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1128', '1.800', '0.1343', '1.799', '0.0897', '7.000', '0.7077', 1, 1, 1, 1, 1724147459.3366637]
VI_after__Init : ['1.202', '0.1128', '1.800', '0.1343', '1.800', '0.0845', '7.000', '0.7079', 1, 1, 1, 1, 1724147467.364976]
VI_at__the_End : ['1.201', '0.4375', '1.800', '0.1362', '1.769', '0.1198', '7.000', '0.7082', 1, 1, 1, 1, 1724147522.5073318]