TEST_NAME : Wafer
TEST_DATE : 24_08_20-11_58_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-008-016-08 | FUSED_ID : 6359364768382353672
  IC_TEMP :  -82.75 | VDDM : 1124.42 | AUX_INT :   -9.96 | CsaBias :   43.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54109e-03 / 2
  ADC_P0  : -9.95830e-03 ± 2.65743e-02
  ADC_P1  : 9.02076e-03 ± 6.87267e-04
  ADC_P2  : -7.26899e-06 ± 3.53583e-06
  CSA_Chi2/NDF : 1.44502e-04 / 2
  CSA_P0  : 5.88091e-02 ± 8.01788e-03
  CSA_P1  : 1.03140e-02 ± 6.04089e-04
  CSA_P2  : -6.86306e-05 ± 9.19957e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  21
 | N_BROKEN_FAST :  [1, 17, 19, 23, 26, 28, 31, 36, 38, 49, 51, 59, 67, 71, 72, 82, 93, 96, 99, 116, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 20, 91, 92, 107, 111, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3249', '1.799', '0.1333', '1.800', '0.0999', '7.000', '0.7076', 1, 1, 1, 1, 1724147885.3364446]
VI_after__Init : ['1.201', '0.3256', '1.800', '0.1343', '1.801', '0.0940', '7.000', '0.7078', 1, 1, 1, 1, 1724147893.495779]
VI_at__the_End : ['1.201', '0.4319', '1.800', '0.1348', '1.754', '0.1200', '7.000', '0.7083', 1, 1, 1, 1, 1724147948.848378]