TEST_NAME : Wafer
TEST_DATE : 24_08_20-11_59_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-008-017-08 | FUSED_ID : 6359364768382353688
  IC_TEMP :  -79.70 | VDDM : 1120.76 | AUX_INT :  -10.12 | CsaBias :   43.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53413e-03 / 2
  ADC_P0  : -1.01194e-02 ± 2.65231e-02
  ADC_P1  : 9.00218e-03 ± 6.88248e-04
  ADC_P2  : -6.96298e-06 ± 3.56185e-06
  CSA_Chi2/NDF : 1.32288e-04 / 2
  CSA_P0  : 6.14507e-02 ± 7.67154e-03
  CSA_P1  : 1.04927e-02 ± 5.77995e-04
  CSA_P2  : -7.00382e-05 ± 8.80219e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 5, 39, 58, 93, 94, 100, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [5, 6, 20, 32, 42, 47, 60, 105, 107, 123, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2264', '1.799', '0.1524', '1.799', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1724147991.1599188]
VI_after__Init : ['1.201', '0.2265', '1.800', '0.1525', '1.800', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1724147999.0692997]
VI_at__the_End : ['1.201', '0.4384', '1.800', '0.1373', '1.772', '0.1200', '7.000', '0.7083', 1, 1, 1, 1, 1724148055.298774]