TEST_NAME : Wafer
TEST_DATE : 24_08_20-12_10_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-008-023-08 | FUSED_ID : 6359364768382353784
  IC_TEMP :  -69.13 | VDDM : 1120.52 | AUX_INT :   -9.89 | CsaBias :   60.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37575e-03 / 2
  ADC_P0  : -9.88839e-03 ± 2.50686e-02
  ADC_P1  : 8.79414e-03 ± 6.30772e-04
  ADC_P2  : -6.88436e-06 ± 3.16480e-06
  CSA_Chi2/NDF : 1.76468e-04 / 2
  CSA_P0  : 6.05424e-02 ± 8.86043e-03
  CSA_P1  : 1.01719e-02 ± 6.67570e-04
  CSA_P2  : -5.89486e-05 ± 1.01663e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [2, 14, 16, 27, 69, 74, 77, 78, 82, 85, 88, 93, 94, 96, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [10, 11, 18, 25, 29, 36, 49, 57, 60, 69, 75, 82, 90, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3156', '1.800', '0.1657', '1.800', '0.0897', '7.000', '0.7072', 1, 1, 1, 1, 1724148631.0952656]
VI_after__Init : ['1.201', '0.3159', '1.800', '0.1658', '1.801', '0.0838', '7.000', '0.7074', 1, 1, 1, 1, 1724148639.0856104]
VI_at__the_End : ['1.201', '0.4639', '1.800', '0.1368', '1.804', '0.1195', '7.000', '0.7079', 1, 1, 1, 1, 1724148694.3962965]