TEST_NAME : Wafer
TEST_DATE : 24_08_20-12_12_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-008-024-08 | FUSED_ID : 6359364768382353800
  IC_TEMP :  -74.61 | VDDM : 1128.37 | AUX_INT :   -8.96 | CsaBias :   60.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36068e-03 / 2
  ADC_P0  : -8.96112e-03 ± 2.50009e-02
  ADC_P1  : 8.75313e-03 ± 6.39995e-04
  ADC_P2  : -6.27197e-06 ± 3.25556e-06
  CSA_Chi2/NDF : 1.80401e-04 / 2
  CSA_P0  : 5.97543e-02 ± 8.95862e-03
  CSA_P1  : 1.05631e-02 ± 6.74968e-04
  CSA_P2  : -6.49279e-05 ± 1.02790e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [8, 13, 15, 24, 54, 64, 73, 89, 93, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [52, 75, 103, 107, 119, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4590', '1.799', '0.1439', '1.800', '0.0998', '7.000', '0.7071', 1, 1, 1, 1, 1724148737.6429126]
VI_after__Init : ['1.201', '0.4608', '1.800', '0.1447', '1.800', '0.0945', '7.000', '0.7073', 1, 1, 1, 1, 1724148744.935292]
VI_at__the_End : ['1.201', '0.4620', '1.800', '0.1366', '1.785', '0.1201', '7.000', '0.7079', 1, 1, 1, 1, 1724148800.3409157]