TEST_NAME : Wafer
TEST_DATE : 24_08_20-12_15_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-008-026-08 | FUSED_ID : 6359364768382353832
  IC_TEMP :  -56.41 | VDDM : 1117.43 | AUX_INT :   -8.98 | CsaBias :   77.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31453e-03 / 2
  ADC_P0  : -8.97711e-03 ± 2.45813e-02
  ADC_P1  : 8.72654e-03 ± 6.31392e-04
  ADC_P2  : -5.94100e-06 ± 3.23070e-06
  CSA_Chi2/NDF : 1.79466e-04 / 2
  CSA_P0  : 6.01736e-02 ± 8.93538e-03
  CSA_P1  : 1.01475e-02 ± 6.73217e-04
  CSA_P2  : -5.33451e-05 ± 1.02523e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [2, 17, 21, 41, 60, 61, 73, 74, 91, 92, 95, 100, 101, 115, 120, 121, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [14, 29, 30, 43, 50, 64, 69, 94, 107, 110, 111, 117, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4964', '1.800', '0.1579', '1.800', '0.0969', '7.000', '0.7075', 1, 1, 1, 1, 1724148950.493157]
VI_after__Init : ['1.201', '0.4976', '1.800', '0.1580', '1.800', '0.0915', '7.000', '0.7073', 1, 1, 1, 1, 1724148958.4555612]
VI_at__the_End : ['1.201', '0.4841', '1.800', '0.1405', '1.807', '0.1137', '7.000', '0.7082', 1, 1, 1, 1, 1724149014.4342263]