TEST_NAME : Wafer
TEST_DATE : 24_08_20-12_49_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-009-010-02 | FUSED_ID : 6359364768382357666
  IC_TEMP :  -90.50 | VDDM : 1126.98 | AUX_INT :  -10.37 | CsaBias :   42.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.83183e-03 / 2
  ADC_P0  : -1.03740e-02 ± 2.91040e-02
  ADC_P1  : 8.81411e-03 ± 7.62609e-04
  ADC_P2  : -5.30341e-06 ± 4.00831e-06
  CSA_Chi2/NDF : 1.12761e-04 / 2
  CSA_P0  : 6.04486e-02 ± 7.08275e-03
  CSA_P1  : 1.06681e-02 ± 5.33634e-04
  CSA_P2  : -7.69724e-05 ± 8.12662e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [32, 33, 39, 45, 54, 57, 59, 66, 99, 109, 117, 125, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [5, 20, 30, 32, 34, 52, 73, 78, 83, 84, 96, 98, 105, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2320', '1.800', '0.1381', '1.799', '0.0906', '7.000', '0.7074', 1, 1, 1, 1, 1724150967.6632829]
VI_after__Init : ['1.201', '0.2324', '1.800', '0.1384', '1.799', '0.0845', '7.000', '0.7074', 1, 1, 1, 1, 1724150975.6606052]
VI_at__the_End : ['1.201', '0.4226', '1.800', '0.1349', '1.746', '0.1200', '7.000', '0.7082', 1, 1, 1, 1, 1724151030.376354]