TEST_NAME : Wafer
TEST_DATE : 24_08_20-12_45_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-009-012-02 | FUSED_ID : 6359364768382357698
  IC_TEMP :  -87.09 | VDDM : 1101.16 | AUX_INT :   -9.39 | CsaBias :   44.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40127e-03 / 2
  ADC_P0  : -9.39062e-03 ± 2.53688e-02
  ADC_P1  : 8.93810e-03 ± 6.62126e-04
  ADC_P2  : -6.45411e-06 ± 3.44401e-06
  CSA_Chi2/NDF : 8.43683e-05 / 2
  CSA_P0  : 6.06713e-02 ± 6.12649e-03
  CSA_P1  : 1.02946e-02 ± 4.61587e-04
  CSA_P2  : -7.56128e-05 ± 7.02943e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [1, 7, 11, 14, 25, 48, 62, 67, 82, 96, 97, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [16, 19, 21, 31, 40, 45, 48, 62, 85, 99, 105, 113, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3596', '1.800', '0.1415', '1.799', '0.0994', '7.000', '0.7075', 1, 1, 1, 1, 1724150754.8518512]
VI_after__Init : ['1.201', '0.3621', '1.800', '0.1428', '1.800', '0.0936', '7.000', '0.7072', 1, 1, 1, 1, 1724150762.8032393]
VI_at__the_End : ['1.201', '0.4055', '1.800', '0.1345', '1.753', '0.1199', '7.000', '0.7082', 1, 1, 1, 1, 1724150817.5450377]