TEST_NAME : Wafer
TEST_DATE : 24_08_20-12_35_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-009-018-05 | FUSED_ID : 6359364768382357797
  IC_TEMP :  -84.30 | VDDM : 1127.88 | AUX_INT :  -10.09 | CsaBias :   44.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43418e-03 / 2
  ADC_P0  : -1.00884e-02 ± 2.55824e-02
  ADC_P1  : 9.19977e-03 ± 6.65993e-04
  ADC_P2  : -8.00756e-06 ± 3.44851e-06
  CSA_Chi2/NDF : 1.26133e-04 / 2
  CSA_P0  : 6.17949e-02 ± 7.49096e-03
  CSA_P1  : 1.08455e-02 ± 5.64390e-04
  CSA_P2  : -7.32577e-05 ± 8.59498e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [2, 6, 7, 10, 39, 40, 55, 61, 81, 88, 90, 102, 108, 109, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [0, 21, 26, 27, 31, 32, 50, 57, 69, 74, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2368', '1.800', '0.1904', '1.799', '0.0956', '7.000', '0.7072', 1, 1, 1, 1, 1724150120.2915914]
VI_after__Init : ['1.201', '0.2367', '1.800', '0.1912', '1.800', '0.0899', '7.000', '0.7075', 1, 1, 1, 1, 1724150128.2279665]
VI_at__the_End : ['1.201', '0.4506', '1.800', '0.1385', '1.744', '0.1200', '7.000', '0.7079', 1, 1, 1, 1, 1724150185.7554708]