TEST_NAME : Wafer
TEST_DATE : 24_08_20-12_26_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-009-023-05 | FUSED_ID : 6359364768382357877
  IC_TEMP :  -82.92 | VDDM : 1124.24 | AUX_INT :  -12.18 | CsaBias :   60.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.26617e-03 / 2
  ADC_P0  : -1.21770e-02 ± 3.22979e-02
  ADC_P1  : 9.18451e-03 ± 8.47160e-04
  ADC_P2  : -7.25762e-06 ± 4.45444e-06
  CSA_Chi2/NDF : 1.53995e-04 / 2
  CSA_P0  : 6.11162e-02 ± 8.27704e-03
  CSA_P1  : 1.06036e-02 ± 6.23615e-04
  CSA_P2  : -6.97675e-05 ± 9.49692e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [7, 9, 27, 36, 37, 38, 43, 44, 47, 51, 64, 67, 68, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [6, 13, 43, 49, 53, 54, 55, 59, 66, 67, 71, 72, 78, 91, 97, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2299', '1.800', '0.1712', '1.800', '0.0899', '7.000', '0.7075', 1, 1, 1, 1, 1724149588.6775737]
VI_after__Init : ['1.201', '0.2302', '1.800', '0.1714', '1.799', '0.0839', '7.000', '0.7076', 1, 1, 1, 1, 1724149596.615946]
VI_at__the_End : ['1.201', '0.4486', '1.800', '0.1376', '1.759', '0.1201', '7.000', '0.7080', 1, 1, 1, 1, 1724149652.8824408]