TEST_NAME : Wafer
TEST_DATE : 24_08_20-13_23_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-010-012-12 | FUSED_ID : 6359364768382361804
  IC_TEMP :  -85.16 | VDDM : 1122.18 | AUX_INT :   -9.43 | CsaBias :   37.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35161e-03 / 2
  ADC_P0  : -9.42959e-03 ± 2.48638e-02
  ADC_P1  : 9.33896e-03 ± 6.65730e-04
  ADC_P2  : -7.87643e-06 ± 3.54124e-06
  CSA_Chi2/NDF : 1.31150e-04 / 2
  CSA_P0  : 5.77385e-02 ± 7.63849e-03
  CSA_P1  : 1.03711e-02 ± 5.75505e-04
  CSA_P2  : -7.05674e-05 ± 8.76426e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [9, 24, 33, 34, 44, 53, 64, 76, 91, 102, 120, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [3, 20, 38, 54, 65, 84, 87, 92, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1485', '1.800', '0.1453', '1.799', '0.0920', '7.000', '0.7076', 1, 1, 1, 1, 1724152991.0694528]
VI_after__Init : ['1.201', '0.1486', '1.800', '0.1454', '1.801', '0.0867', '7.000', '0.7077', 1, 1, 1, 1, 1724152999.0998256]
VI_at__the_End : ['1.201', '0.4278', '1.800', '0.1345', '1.737', '0.1200', '7.000', '0.7082', 1, 1, 1, 1, 1724153053.9757357]