TEST_NAME : Wafer
TEST_DATE : 24_08_20-13_24_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-010-013-12 | FUSED_ID : 6359364768382361820
  IC_TEMP :  -78.26 | VDDM : 1114.02 | AUX_INT :  -13.14 | CsaBias :   49.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.60950e-03 / 2
  ADC_P0  : -1.31384e-02 ± 3.46831e-02
  ADC_P1  : 9.06703e-03 ± 8.96326e-04
  ADC_P2  : -6.89202e-06 ± 4.66247e-06
  CSA_Chi2/NDF : 1.44089e-04 / 2
  CSA_P0  : 5.85497e-02 ± 8.00640e-03
  CSA_P1  : 1.01055e-02 ± 6.03225e-04
  CSA_P2  : -6.48514e-05 ± 9.18640e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [5, 6, 21, 27, 30, 32, 42, 45, 48, 57, 58, 61, 72, 80, 90, 112, 119, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [1, 3, 15, 35, 39, 46, 74, 99, 108, 117, 121, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2257', '1.800', '0.1645', '1.799', '0.1016', '7.000', '0.7083', 1, 1, 1, 1, 1724153097.8944101]
VI_after__Init : ['1.201', '0.2262', '1.800', '0.1648', '1.800', '0.0937', '7.000', '0.7076', 1, 1, 1, 1, 1724153105.9168181]
VI_at__the_End : ['1.201', '0.4337', '1.800', '0.1362', '1.783', '0.1198', '7.000', '0.7083', 1, 1, 1, 1, 1724153160.952728]