TEST_NAME : Wafer
TEST_DATE : 24_08_20-13_30_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-010-016-11 | FUSED_ID : 6359364768382361867
  IC_TEMP :  -76.02 | VDDM : 1118.66 | AUX_INT :   -9.46 | CsaBias :   54.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36167e-03 / 2
  ADC_P0  : -9.45938e-03 ± 2.49391e-02
  ADC_P1  : 9.17831e-03 ± 6.50861e-04
  ADC_P2  : -8.00246e-06 ± 3.36734e-06
  CSA_Chi2/NDF : 1.61635e-04 / 2
  CSA_P0  : 5.90362e-02 ± 8.47989e-03
  CSA_P1  : 1.05056e-02 ± 6.38899e-04
  CSA_P2  : -6.63928e-05 ± 9.72967e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [10, 11, 12, 13, 33, 41, 44, 53, 57, 82, 86, 94, 101, 108, 111, 112, 113, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [11, 15, 31, 35, 42, 45, 55, 79, 89, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2354', '1.800', '0.1571', '1.799', '0.0912', '7.000', '0.7076', 1, 1, 1, 1, 1724153418.5066757]
VI_after__Init : ['1.201', '0.2356', '1.800', '0.1571', '1.800', '0.0855', '7.000', '0.7079', 1, 1, 1, 1, 1724153426.5559676]
VI_at__the_End : ['1.201', '0.4512', '1.800', '0.1387', '1.804', '0.1197', '7.000', '0.7086', 1, 1, 1, 1, 1724153481.1929395]