TEST_NAME : Wafer
TEST_DATE : 24_08_20-13_33_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-010-018-11 | FUSED_ID : 6359364768382361899
  IC_TEMP :  -73.43 | VDDM : 1121.98 | AUX_INT :   -9.19 | CsaBias :   69.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58549e-03 / 2
  ADC_P0  : -9.19427e-03 ± 2.70297e-02
  ADC_P1  : 8.78839e-03 ± 6.98361e-04
  ADC_P2  : -6.14040e-06 ± 3.58736e-06
  CSA_Chi2/NDF : 1.43102e-04 / 2
  CSA_P0  : 6.25814e-02 ± 7.97895e-03
  CSA_P1  : 9.91531e-03 ± 6.01156e-04
  CSA_P2  : -5.70953e-05 ± 9.15490e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [0, 15, 18, 21, 42, 47, 61, 78, 84, 101, 118, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [0, 1, 36, 64, 65, 73, 81, 86, 87, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.0863', '1.800', '0.1516', '1.799', '0.0813', '7.000', '0.7078', 1, 1, 1, 1, 1724153631.5965312]
VI_after__Init : ['1.202', '0.0863', '1.800', '0.1516', '1.799', '0.0762', '7.000', '0.7076', 1, 1, 1, 1, 1724153638.8208568]
VI_at__the_End : ['1.201', '0.4548', '1.800', '0.1390', '1.801', '0.1205', '7.000', '0.7084', 1, 1, 1, 1, 1724153694.184018]