TEST_NAME : Wafer
TEST_DATE : 24_08_20-13_40_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-010-022-11 | FUSED_ID : 6359364768382361963
  IC_TEMP :  -66.71 | VDDM : 1121.66 | AUX_INT :   -8.98 | CsaBias :   67.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34355e-03 / 2
  ADC_P0  : -8.98450e-03 ± 2.48341e-02
  ADC_P1  : 8.58952e-03 ± 6.22344e-04
  ADC_P2  : -6.10937e-06 ± 3.10038e-06
  CSA_Chi2/NDF : 1.57963e-04 / 2
  CSA_P0  : 5.75731e-02 ± 8.38302e-03
  CSA_P1  : 9.99739e-03 ± 6.31600e-04
  CSA_P2  : -5.65802e-05 ± 9.61852e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [24, 29, 34, 38, 41, 48, 65, 68, 80, 86, 92, 97, 104, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [10, 38, 41, 44, 52, 54, 55, 69, 78, 91, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1962', '1.799', '0.1599', '1.799', '0.0892', '7.000', '0.7078', 1, 1, 1, 1, 1724154057.307363]
VI_after__Init : ['1.201', '0.1965', '1.800', '0.1598', '1.800', '0.0831', '7.000', '0.7079', 1, 1, 1, 1, 1724154065.2517178]
VI_at__the_End : ['1.201', '0.4565', '1.800', '0.1330', '1.804', '0.1201', '7.000', '0.7086', 1, 1, 1, 1, 1724154123.079975]