TEST_NAME : Wafer
TEST_DATE : 24_08_20-13_44_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-010-024-11 | FUSED_ID : 6359364768382361995
  IC_TEMP :  -69.10 | VDDM : 1120.47 | AUX_INT :  -10.23 | CsaBias :   66.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.77413e-03 / 2
  ADC_P0  : -1.02347e-02 ± 2.86007e-02
  ADC_P1  : 8.54430e-03 ± 7.13039e-04
  ADC_P2  : -5.79897e-06 ± 3.54995e-06
  CSA_Chi2/NDF : 1.77316e-04 / 2
  CSA_P0  : 6.02308e-02 ± 8.88170e-03
  CSA_P1  : 1.03450e-02 ± 6.69172e-04
  CSA_P2  : -6.05867e-05 ± 1.01907e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [3, 4, 6, 28, 29, 30, 35, 42, 60, 77, 94, 100, 107, 109, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [8, 11, 14, 20, 28, 56, 62, 64, 75, 89, 94, 108, 114, 115, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4693', '1.800', '0.1165', '1.799', '0.0986', '7.000', '0.7078', 1, 1, 1, 1, 1724154271.6349478]
VI_after__Init : ['1.201', '0.4702', '1.800', '0.1168', '1.801', '0.0929', '7.000', '0.7079', 1, 1, 1, 1, 1724154279.6712556]
VI_at__the_End : ['1.201', '0.4659', '1.800', '0.1350', '1.805', '0.1165', '7.000', '0.7084', 1, 1, 1, 1, 1724154336.080731]