TEST_NAME : Wafer
TEST_DATE : 24_08_20-13_46_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-010-025-11 | FUSED_ID : 6359364768382362011
  IC_TEMP :  -71.53 | VDDM : 1115.76 | AUX_INT :  -10.37 | CsaBias :   50.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.56240e-03 / 2
  ADC_P0  : -1.03678e-02 ± 2.67479e-02
  ADC_P1  : 8.67909e-03 ± 6.65050e-04
  ADC_P2  : -6.61583e-06 ± 3.29996e-06
  CSA_Chi2/NDF : 1.83679e-04 / 2
  CSA_P0  : 5.94986e-02 ± 9.03967e-03
  CSA_P1  : 1.03776e-02 ± 6.81074e-04
  CSA_P2  : -6.15831e-05 ± 1.03719e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [1, 8, 10, 26, 29, 40, 50, 57, 70, 83, 88, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [29, 48, 52, 57, 61, 74, 77, 83, 89, 90, 92, 96, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3762', '1.800', '0.1610', '1.799', '0.0978', '7.000', '0.7078', 1, 1, 1, 1, 1724154377.9633]
VI_after__Init : ['1.202', '0.3762', '1.800', '0.1610', '1.800', '0.0922', '7.000', '0.7077', 1, 1, 1, 1, 1724154385.9786682]
VI_at__the_End : ['1.201', '0.4621', '1.800', '0.1349', '1.803', '0.1188', '7.000', '0.7086', 1, 1, 1, 1, 1724154443.123102]