TEST_NAME : Wafer
TEST_DATE : 24_08_20-14_12_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-011-015-01 | FUSED_ID : 6359364768382365937
  IC_TEMP :  -81.27 | VDDM : 1118.75 | AUX_INT :  -12.74 | CsaBias :   51.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.27315e-03 / 2
  ADC_P0  : -1.27426e-02 ± 3.22819e-02
  ADC_P1  : 9.19005e-03 ± 8.36583e-04
  ADC_P2  : -7.55278e-06 ± 4.35785e-06
  CSA_Chi2/NDF : 1.34732e-04 / 2
  CSA_P0  : 5.78395e-02 ± 7.74207e-03
  CSA_P1  : 1.06268e-02 ± 5.83309e-04
  CSA_P2  : -7.23900e-05 ± 8.88311e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  72
 | N_BROKEN_FAST :  [0, 1, 2, 4, 5, 6, 7, 8, 11, 12, 16, 18, 19, 20, 21, 23, 30, 31, 32, 36, 37, 39, 40, 41, 43, 44, 47, 55, 57, 59, 64, 68, 69, 70, 71, 74, 75, 82, 84, 95, 98, 100, 106, 108, 111, 113, 114, 115, 119, 120, 122]
 | N_BROKEN_SLOW :  [0, 1, 2, 3, 4, 5, 6, 7, 8, 12, 16, 22, 32, 34, 35, 36, 38, 39, 98, 102, 106]
   P_BROKEN_DISC :  22
 | P_BROKEN_FAST :  [0, 3, 4, 12, 20, 32, 35, 44, 64, 79, 80, 87, 99, 103, 115, 119]
 | P_BROKEN_SLOW :  [0, 3, 4, 7, 32, 36]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1714', '1.800', '0.1588', '1.799', '0.0905', '7.000', '0.7077', 1, 1, 1, 1, 1724155970.3226445]
VI_after__Init : ['1.201', '0.1716', '1.800', '0.1589', '1.800', '0.0847', '7.000', '0.7076', 1, 1, 1, 1, 1724155978.330993]
VI_at__the_End : ['1.201', '0.4367', '1.800', '0.1390', '1.784', '0.1201', '7.000', '0.7084', 1, 1, 1, 1, 1724156034.5136392]