TEST_NAME : Wafer
TEST_DATE : 24_08_20-14_03_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-011-020-06 | FUSED_ID : 6359364768382366022
  IC_TEMP :  -73.98 | VDDM : 1121.35 | AUX_INT :  -48.32 | CsaBias :   23.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.05217e-03 / 2
  ADC_P0  : -4.83211e-02 ± 3.29951e-02
  ADC_P1  : 9.09355e-03 ± 7.99163e-04
  ADC_P2  : -8.04324e-06 ± 3.85596e-06
  CSA_Chi2/NDF : 1.35225e-04 / 2
  CSA_P0  : 5.75544e-02 ± 7.75622e-03
  CSA_P1  : 1.02388e-02 ± 5.84375e-04
  CSA_P2  : -6.31861e-05 ± 8.89935e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [30, 33, 45, 50, 60, 63, 70, 82, 95, 96, 107, 112, 115, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [5, 15, 36, 40, 42, 44, 48, 51, 62, 70, 103, 108, 122, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4092', '1.800', '0.1548', '1.800', '0.1048', '7.000', '0.7079', 1, 1, 1, 1, 1724155438.4954402]
VI_after__Init : ['1.201', '0.4115', '1.800', '0.1560', '1.801', '0.0988', '7.000', '0.7081', 1, 1, 1, 1, 1724155446.6587677]
VI_at__the_End : ['1.201', '0.4473', '1.800', '0.1325', '1.803', '0.1209', '7.000', '0.7086', 1, 1, 1, 1, 1724155502.7573636]