TEST_NAME : Wafer
TEST_DATE : 24_08_20-14_02_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-011-021-06 | FUSED_ID : 6359364768382366038
  IC_TEMP :  -76.03 | VDDM : 1119.37 | AUX_INT :   -8.44 | CsaBias :   53.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16572e-03 / 2
  ADC_P0  : -8.44250e-03 ± 2.31124e-02
  ADC_P1  : 8.87785e-03 ± 5.99000e-04
  ADC_P2  : -6.58801e-06 ± 3.08202e-06
  CSA_Chi2/NDF : 1.64109e-04 / 2
  CSA_P0  : 5.94295e-02 ± 8.54453e-03
  CSA_P1  : 1.04079e-02 ± 6.43769e-04
  CSA_P2  : -6.42264e-05 ± 9.80384e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [2, 28, 35, 37, 88, 93, 94, 102, 103, 120, 125, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  18
 | P_BROKEN_FAST :  [11, 30, 36, 47, 52, 55, 58, 66, 78, 87, 92, 93, 94, 108, 120, 122, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2290', '1.800', '0.1254', '1.799', '0.0959', '7.000', '0.7079', 1, 1, 1, 1, 1724155331.948781]
VI_after__Init : ['1.201', '0.2292', '1.800', '0.1254', '1.800', '0.0901', '7.000', '0.7076', 1, 1, 1, 1, 1724155340.0152113]
VI_at__the_End : ['1.201', '0.4560', '1.800', '0.1370', '1.779', '0.1199', '7.000', '0.7084', 1, 1, 1, 1, 1724155396.394806]