TEST_NAME : Wafer
TEST_DATE : 24_08_20-13_56_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-011-024-06 | FUSED_ID : 6359364768382366086
  IC_TEMP :  -65.59 | VDDM : 1115.71 | AUX_INT :  -11.44 | CsaBias :   58.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.04060e-03 / 2
  ADC_P0  : -1.14430e-02 ± 3.06387e-02
  ADC_P1  : 8.78951e-03 ± 7.71491e-04
  ADC_P2  : -6.68113e-06 ± 3.88359e-06
  CSA_Chi2/NDF : 1.65411e-04 / 2
  CSA_P0  : 6.28954e-02 ± 8.57837e-03
  CSA_P1  : 1.05713e-02 ± 6.46318e-04
  CSA_P2  : -6.18450e-05 ± 9.84266e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [5, 10, 17, 18, 23, 28, 35, 41, 42, 50, 61, 64, 69, 75, 116, 117, 126, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [18, 24, 28, 34, 40, 58, 67, 70, 78, 87, 107, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3089', '1.800', '0.1366', '1.799', '0.0952', '7.000', '0.7079', 1, 1, 1, 1, 1724155011.5059776]
VI_after__Init : ['1.201', '0.3090', '1.800', '0.1368', '1.799', '0.0901', '7.000', '0.7079', 1, 1, 1, 1, 1724155018.8704498]
VI_at__the_End : ['1.201', '0.4766', '1.800', '0.1399', '1.803', '0.1163', '7.000', '0.7086', 1, 1, 1, 1, 1724155075.8229444]