TEST_NAME : Wafer
TEST_DATE : 24_08_20-14_57_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-012-013-09 | FUSED_ID : 6359364768382370009
  IC_TEMP :  -82.52 | VDDM : 1119.70 | AUX_INT :   -9.75 | CsaBias :   45.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57341e-03 / 2
  ADC_P0  : -9.74765e-03 ± 2.68521e-02
  ADC_P1  : 9.21730e-03 ± 7.07487e-04
  ADC_P2  : -7.85468e-06 ± 3.69702e-06
  CSA_Chi2/NDF : 1.65489e-04 / 2
  CSA_P0  : 6.05867e-02 ± 8.58040e-03
  CSA_P1  : 1.03542e-02 ± 6.46471e-04
  CSA_P2  : -6.79536e-05 ± 9.84499e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [11, 20, 32, 42, 46, 48, 54, 61, 72, 74, 90, 116, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [6, 10, 13, 16, 23, 44, 50, 55, 68, 71, 82, 85, 102, 111, 113, 117, 119, 122, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4023', '1.800', '0.1645', '1.799', '0.0990', '7.000', '0.7077', 1, 1, 1, 1, 1724158633.50912]
VI_after__Init : ['1.201', '0.4040', '1.800', '0.1656', '1.801', '0.0931', '7.000', '0.7077', 1, 1, 1, 1, 1724158641.5495017]
VI_at__the_End : ['1.201', '0.4400', '1.800', '0.1387', '1.782', '0.1199', '6.998', '0.7086', 1, 1, 1, 1, 1724158697.5513988]