TEST_NAME : Wafer
TEST_DATE : 24_08_20-15_00_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-012-015-09 | FUSED_ID : 6359364768382370041
  IC_TEMP :  -91.53 | VDDM : 1118.28 | AUX_INT :  -12.55 | CsaBias :   58.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.32971e-03 / 2
  ADC_P0  : -1.25478e-02 ± 3.27567e-02
  ADC_P1  : 8.97297e-03 ± 8.46306e-04
  ADC_P2  : -6.39748e-06 ± 4.40678e-06
  CSA_Chi2/NDF : 8.33848e-05 / 2
  CSA_P0  : 5.93073e-02 ± 6.09068e-03
  CSA_P1  : 1.07530e-02 ± 4.58889e-04
  CSA_P2  : -7.90903e-05 ± 6.98833e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [1, 12, 24, 42, 44, 56, 61, 70, 71, 74, 76, 88, 92, 95, 97, 103, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [4, 6, 11, 32, 36, 44, 48, 52, 78, 93, 99, 100, 126]
 | P_BROKEN_SLOW :  [52]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2080', '1.800', '0.1782', '1.799', '0.0950', '7.000', '0.7079', 1, 1, 1, 1, 1724158846.3472917]
VI_after__Init : ['1.201', '0.2082', '1.800', '0.1776', '1.801', '0.0895', '7.000', '0.7076', 1, 1, 1, 1, 1724158854.3937452]
VI_at__the_End : ['1.201', '0.4190', '1.800', '0.1352', '1.771', '0.1199', '7.000', '0.7083', 1, 1, 1, 1, 1724158909.1306603]