TEST_NAME : Wafer
TEST_DATE : 24_08_20-15_06_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-012-018-14 | FUSED_ID : 6359364768382370094
  IC_TEMP :  -86.87 | VDDM : 1101.41 | AUX_INT :  -10.86 | CsaBias :   41.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.83083e-03 / 2
  ADC_P0  : -1.08552e-02 ± 2.89581e-02
  ADC_P1  : 8.78382e-03 ± 7.17979e-04
  ADC_P2  : -7.35941e-06 ± 3.53913e-06
  CSA_Chi2/NDF : 2.15657e-04 / 2
  CSA_P0  : 5.87525e-02 ± 9.79498e-03
  CSA_P1  : 1.04857e-02 ± 7.37981e-04
  CSA_P2  : -7.23928e-05 ± 1.12386e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [0, 12, 22, 43, 71, 89, 91, 96, 116, 119, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [0, 18, 25, 34, 37, 42, 56, 58, 66, 69, 70, 93, 94, 102]
 | P_BROKEN_SLOW :  [109]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4410', '1.800', '0.1394', '1.799', '0.1009', '7.000', '0.7079', 1, 1, 1, 1, 1724159166.5844848]
VI_after__Init : ['1.201', '0.4420', '1.800', '0.1404', '1.800', '0.0956', '7.000', '0.7080', 1, 1, 1, 1, 1724159173.9048896]
VI_at__the_End : ['1.201', '0.4271', '1.800', '0.1349', '1.800', '0.1185', '7.000', '0.7085', 1, 1, 1, 1, 1724159229.1757145]