TEST_NAME : Wafer
TEST_DATE : 24_08_20-15_16_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-012-024-14 | FUSED_ID : 6359364768382370190
  IC_TEMP :  -72.40 | VDDM : 1092.45 | AUX_INT :  -10.33 | CsaBias :   57.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.82559e-03 / 2
  ADC_P0  : -1.03304e-02 ± 2.90125e-02
  ADC_P1  : 8.53297e-03 ± 7.23307e-04
  ADC_P2  : -5.74285e-06 ± 3.60108e-06
  CSA_Chi2/NDF : 1.99622e-04 / 2
  CSA_P0  : 5.90304e-02 ± 9.42380e-03
  CSA_P1  : 1.01792e-02 ± 7.10015e-04
  CSA_P2  : -6.24983e-05 ± 1.08127e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [3, 9, 25, 69, 75, 76, 89, 97, 108, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [32, 37, 38, 39, 45, 59, 69, 70, 71, 84, 88, 96, 106, 117, 121, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1558', '1.800', '0.1443', '1.799', '0.0842', '7.000', '0.7079', 1, 1, 1, 1, 1724159807.5936081]
VI_after__Init : ['1.202', '0.1560', '1.800', '0.1443', '1.799', '0.0785', '7.000', '0.7080', 1, 1, 1, 1, 1724159815.5479262]
VI_at__the_End : ['1.201', '0.4495', '1.800', '0.1325', '1.784', '0.1198', '7.000', '0.7085', 1, 1, 1, 1, 1724159871.716256]