TEST_NAME : Wafer
TEST_DATE : 24_08_20-15_18_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-012-025-14 | FUSED_ID : 6359364768382370206
  IC_TEMP :  -68.80 | VDDM : 1116.06 | AUX_INT :  -10.27 | CsaBias :   59.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73793e-03 / 2
  ADC_P0  : -1.02667e-02 ± 2.82358e-02
  ADC_P1  : 8.73511e-03 ± 7.03912e-04
  ADC_P2  : -6.99014e-06 ± 3.48653e-06
  CSA_Chi2/NDF : 1.61352e-04 / 2
  CSA_P0  : 5.84043e-02 ± 8.47247e-03
  CSA_P1  : 9.60590e-03 ± 6.38339e-04
  CSA_P2  : -5.07162e-05 ± 9.72115e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [5, 8, 21, 28, 31, 41, 76, 86, 99, 103, 104, 110, 120, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [19, 30, 42, 45, 78, 91, 103, 107, 110, 112, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0777', '1.800', '0.1100', '1.799', '0.0890', '7.000', '0.7086', 1, 1, 1, 1, 1724159914.2107534]
VI_after__Init : ['1.202', '0.0777', '1.800', '0.1100', '1.800', '0.0810', '7.000', '0.7079', 1, 1, 1, 1, 1724159922.305084]
VI_at__the_End : ['1.201', '0.4568', '1.800', '0.1342', '1.802', '0.1182', '7.000', '0.7086', 1, 1, 1, 1, 1724159977.658634]