TEST_NAME : Wafer
TEST_DATE : 24_08_20-15_22_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-009-012-027-14 | FUSED_ID : 6359364768382370238
  IC_TEMP :  -66.69 | VDDM : 1109.67 | AUX_INT :  -11.09 | CsaBias :   56.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.15746e-03 / 2
  ADC_P0  : -1.10917e-02 ± 3.15412e-02
  ADC_P1  : 8.47438e-03 ± 7.70439e-04
  ADC_P2  : -6.09256e-06 ± 3.75452e-06
  CSA_Chi2/NDF : 1.38157e-04 / 2
  CSA_P0  : 5.74447e-02 ± 7.83988e-03
  CSA_P1  : 9.58669e-03 ± 5.90678e-04
  CSA_P2  : -4.92530e-05 ± 8.99533e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [28, 29, 37, 74, 76, 77, 83, 84, 99, 103, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [4, 16, 29, 30, 35, 37, 49, 66, 80, 81, 85, 86, 87, 113, 115, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1262', '1.800', '0.1604', '1.799', '0.0863', '7.000', '0.7081', 1, 1, 1, 1, 1724160127.8874125]
VI_after__Init : ['1.202', '0.1261', '1.800', '0.1604', '1.800', '0.0807', '7.000', '0.7080', 1, 1, 1, 1, 1724160135.8407688]
VI_at__the_End : ['1.202', '0.4612', '1.800', '0.1296', '1.802', '0.1195', '7.000', '0.7086', 1, 1, 1, 1, 1724160193.2622035]